Elemental and Chemical Characterization of Solid Surfaces with Soft X-Ray Appearance Potential Spectroscopy.
Abstract
A study on the suitability of using a soft x-ray appearance potential spectrometer as a measurement tool for characterizing elemental and chemical species on solid surfaces has been completed. Two principal objectives of the research have been (1) to assess such characterization capabilities for analysis of materials that are of interest to ongoing research and development programs of the Air Force Materials Laboratory and (2) to demonstrate experimental techniques which improve the instrumentation. The authors present and interpret experimental measurements that show (1) this technique is sensitive to the molecular state of titanium atoms in several compounds, (2) the sensitivity of SXAPS to different elements depends strongly upon the atomic number, (3) one major reason which explains much of this Z-dependence is the excitation of threshold resonant x-rays at some core levels in many elements, and (4) there is available experimental apparatus which can be used to significantly improve the signal-to-noise ratio in the observed spectra.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1974
- Accession Number
- ADA003326
Entities
People
- Merrill B. Chamberlain
- William L. Baun
Organizations
- Air Force Research Laboratory