Microcircuit Generic Environmental Data.

Abstract

The compendium contains environmental test and screen/burn-in results on microcircuit devices. Data are organized according to applied test stress and device generic properties. Aside from a description of the device and stress conditions, each entry reports the number of devices tested, number failed and observed failure modes. A total of 1563 data entries are contained in this monolithic environmental data and screen/burn-in results. This compendium is revised and reissued annually.

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1974
Accession Number
ADA003618

Entities

Organizations

  • IIT Research Institute

Tags

DTIC Thesaurus Topics

  • Circuits
  • Electronics
  • Engineering
  • Environmental Tests
  • Failure Mode And Effect Analysis
  • Microcircuits
  • Microelectronics
  • Networks

Readers

  • European Security and Defence Policy (ESDP).
  • Integrated Circuit Design and Technology.
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems