Introductory Statistical Analysis of Wireline Transients and Error Patterns.
Abstract
The investigation of analog wireline transients is discussed from the point of view of modeling the digital error patterns which the transients produce. A detailed explanation of the transient and error pattern collection systems is presented. The analytical approach used is a qualitative comparison of the statistical distributions of transients and error bursts. The analysis reveals that, at a data rate of 9600 bits per second, the error bursts occur according to a Poisson process over half the time, but non-Poisson process(es) predominate at 4800 bps. The occurrences of the transients are found to always differ from a Poisson process. This is interpreted as evidence that something other than transients causes the Poisson distributed error bursts; an alternative cause is briefly discussed. Also, a cause-effect relationship for transients and non-Poisson bursts is postulated.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1975
- Accession Number
- ADA004769
Entities
People
- William T. Lynch
Organizations
- Rome Laboratory