Advanced Electro-Optical System Hardening. Phase II: Computer-Aided Susceptibility Analysis of the HOST Sensor Amplifier to IEMP.

Abstract

The study examines the vulnerability of one channel of the HOST detector amplifier to internal electromagnetic pulse (IEMP) induced transients coupling into the circuit at certain selected locations. Only the effects of the induced transients on the circuit, including transient-radiation effects on electronics (TREE) effects, are studied, not the IEMP coupling modes. The entry points for the transients are assumed to be cables interconnecting the various subcircuits composing the amplifier. The circuit operation was simulated using the NET-2 network analysis computer program. In the simulation, models were used which incorporated both linear and nonlinear operating characteristics. The induced transients were simulated using current pulses 1 sq microsec. HDL experimental component failure data for 1-microsec pulses were used for circuit component failure criteria.

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1974
Accession Number
ADA005084

Entities

People

  • John L. Gilbert

Tags

Communities of Interest

  • Sensors

DTIC Thesaurus Topics

  • Amplifiers
  • Computer Programs
  • Computers
  • Couplings
  • Detectors
  • Electromagnetic Pulses
  • Internal Electromagnetic Pulses
  • Radiation
  • Radiation Effects
  • Simulations
  • Simulators

Fields of Study

  • Physics

Readers

  • Chemistry (specifically Chemical Fluorescence)
  • Integrated Circuit Design and Technology.
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems