Optical Constants of SiO in the IR Region.
Abstract
Values of the optical constants, n and k (n bar = n - i k), of vacuum deposited thin films of silicon monoxide over the range 1.0 to 50.0 microns, obtained from Attenuated Total Reflectance (ATR) are computed with a simple rigorous method. The ATR element used is a commercial one. A analysis is also presented of the calculation of n and k from transmission measurements showing consistency with ATR measurements for a liquid sample. A double beam ATR system is described for making precise measurements at a variable angle of incidence of the reflectivity using only one hemicylindrical reflectance element. The cell has two compartments for sample and reference beam respectively. The beam has a wedge shape with the focal line parallel to the cylinder axis and the optical elements are all standard mirrors.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1974
- Accession Number
- ADA005086
Entities
People
- D. Escolar
- J. Morcillo