Optical Materials Characterization

Abstract

The authors have measured the following parameters of chemical vapor deposited polycrystalline ZnSe (CVD ZnSe): Refractive index and change of index of refraction with temperature (dn/dT) over the wavelength range 0.5 micrometers to 18 micrometers using the method of minimum deviation; the coefficient of linear thermal expansion and dn/dT at 10.6 micrometers using Fizeau interferometry; and the elastic moduli and photoelastic moduli using Fizeau and Twyman-Green interferometry. A sensitive technique has been developed for measuring stress-optical constants of materials that exhibit a small stress- optical effect.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1975
Accession Number
ADA005410

Entities

People

  • Albert R. Feldman
  • Deane Horowitz
  • Irving Malitson
  • Marilyn J. Dodge
  • Roy M. Waxler

Organizations

  • National Institute of Standards and Technology

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Amplifiers
  • Chemical Vapor Deposition
  • Coefficients
  • Compound Semiconductors
  • Department Of Defense
  • Elastic Properties
  • Infrared Lasers
  • Interferometry
  • Lasers
  • Materials
  • Measurement
  • Optical Materials
  • Polycrystals
  • Radiation
  • Refractive Index
  • Single Crystals
  • Thermal Expansion

Fields of Study

  • Physics

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Optical Physics and Photonics.