Design Optimization of Metal-Insulator-Semiconductor Devices for Infrared Solid State Imaging.

Abstract

The study provides a methodology for design optimization of metal-insulator-semiconductor device used as charge storage infrared detectors. A new general formulation for the calculation of efficient charge storage capacity is derived and compared to existing formulas. Design parameter constraints are examined and several performance improvement techniques are discussed. A new device structure is proposed which integrates many desirable features into a single element. The results of this study indicate that the trend should be toward charge injection devices constructed of p-type group IV-VI thin film semiconductors with high dielectric constant insulators using back-illumination through anti-reflection layers.

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1974
Accession Number
ADA005472

Entities

People

  • Numa Augustine Boudreaux Iii

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Detectors
  • Dielectric Permittivity
  • Dielectrics
  • Electronics
  • Films
  • Illumination
  • Infrared Detectors
  • Materials Testing
  • Optimization
  • Reflection
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics
  • Test Methods
  • Thin Films

Fields of Study

  • Materials science

Readers

  • Image Processing and Computer Vision.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics