Nuclear Radiation Testing of Diodes, Silicon Controlled Rectifiers, Transistors and Integrated Circuits

Abstract

Extensive nuclear radiation tests were conducted on various types of diodes, transistors, silicon controlled rectifiers, DTL and CMOS integrated circuits for use in digital electronics. The nuclear radiation effects considered during this test program were endoatmospheric, i.e. neutron and gamma dose rates. The digital electronics employing the semiconductors tested are used in either ground systems or low-flying missiles, therefore, no exoatmospheric effects such as x-rays were evaluated. The report documents the components tested, test methods, radiation test facilities used and the test results for each component tested.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1974
Accession Number
ADA005590

Entities

People

  • E. T. Cassidy

Organizations

  • Picatinny Arsenal

Tags

DTIC Thesaurus Topics

  • Circuit Testers
  • Dielectrics
  • Digital Circuits
  • Dose Rate
  • Electronics Laboratories
  • Fast Neutrons
  • Field Effect Transistors
  • Gamma Rays
  • Modules (Electronics)
  • Nuclear Radiation
  • Power Electronics
  • Radiation Effects
  • Semiconductor Devices
  • Semiconductors
  • Silicon Controlled Rectifiers
  • Test Equipment
  • Test Methods

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Missile Defense Systems.
  • Solar Physics

Technology Areas

  • Microelectronics