Component Damage/Malfunction Levels.

Abstract

Damage/malfunction thresholds for mission-critical EMP-sensitive equipment of the SAFEGUARD Tactical Support Equipment have been determined by analysis and by laboratory tests. For inductive components and equipments insulation breakdown is the damage mechanism. For equipment containing solid-state semiconductors burnout of the sensitive piecepart governs. For low-voltage capacitors overvoltage at the capacitor is the damage mechanism. Methods used to calculate the damage/malfunction thresholds are given and a summary of the laboratory test results.

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1974
Accession Number
ADA005617

Entities

Organizations

  • Boeing

Tags

DTIC Thesaurus Topics

  • Buildings And Structures
  • Capacitors
  • Compound Semiconductors
  • Electronic Equipment
  • Electronics
  • Insulation
  • Laboratory Tests
  • Low Voltage
  • Malfunctions
  • Research Facilities
  • Semiconductors
  • Solid State Electronics
  • Voltage

Fields of Study

  • Physics

Readers

  • Cybersecurity.
  • Electrical Engineering

Technology Areas

  • Microelectronics