SETE Workshop Proceedings. Advanced Techniques for Automatic Testing and Built in Test Equipment (BITE) for Test, Measurement and Diagnostic Equipment (TMDE),
Abstract
The presentations made during this two day meeting reflected in summary fromat the pertinent research and development activities in automation and built in test sponsored by DOD, NASA, the Department of Commerce, industry and academia.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1974
- Accession Number
- ADA005670
Entities
People
- David M. Goodman