Luminescence and Hall Effect of Ion Implanted Layers in ZnO.

Abstract

An experimental investigation was conducted on implanted layers of Li, Na, N, P, and Ne in ZnO substrates. The primary experimental method used was cathodoluminescence, and it was found that it was possible to probe an implanted layer by varying the beam voltage of the exciting electrons. The electrical properties of the implanted layers were obtained using the van der Pauw technique, and a photoluminescence system incorporating a Nitrogen laser was used to perform time-resolved spectroscopy. Optical evidence of a shallow acceptor center in ZnO was revealed for the first time in the cathodoluminescent spectra obtained from implanted samples of ZnO; however, no evidence of type conversion and pn-junction formation was found in the electrical measurements.

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1974
Accession Number
ADA005899

Entities

People

  • Bruce J. Pierce

Organizations

  • Air Force Institute of Technology

Tags

DTIC Thesaurus Topics

  • Cathodoluminescence
  • Conversion
  • Electrical Measurement
  • Electrical Properties
  • Electrons
  • Hall Effect
  • Laser Applications
  • Laser Spectroscopy
  • Lasers
  • Luminescence
  • Measurement
  • Nitrogen Lasers
  • P-N Junctions
  • Photoluminescence
  • Spectra
  • Spectroscopy

Fields of Study

  • Materials science

Readers

  • Molecular Photonics/Laser Physics
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene