Electron Beam Semiconductor Device with Mesa Diode, Reliability and Failure Determination.
Abstract
Ten water cooled EBS devices were fabricated, processed and delivered to ECOM for life and reliability tests. Of 4 tubes tested thus far one was operated for 1200 hours at a maximum dissipation of 7 watts. Others had relatively shorter life times. In depth analysis of failure was carried out on 2 tubes.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1975
- Accession Number
- ADA007277
Entities
People
- G. Demars
- K. Garewal
- R. Bierig