Long Term Reliability Investigations of the MSC-1330 Microwave Power Transistor and the AMPAC 1214-30 Internally Matched Device

Abstract

The objective of the program is to establish the median-time-to-failure (MTF) of the MSC-1330 transistor series using long term accelerated RF life tests of the order of 10,000 hours duration.

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Document Details

Document Type
Technical Report
Publication Date
Mar 10, 1975
Accession Number
ADA007354

Entities

People

  • Louis G. Walshak

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Aluminum
  • Amorphous Materials
  • Bench Tests
  • Circuits
  • Electron Microscopes
  • Failure Mode And Effect Analysis
  • Hot Spots
  • Life Tests
  • Materials
  • Metals
  • Microscopes
  • Military Research
  • Scanning Electron Microscopes
  • Semiconductors
  • Short Circuits
  • Static Tests
  • Transistors

Readers

  • Electrical Engineering
  • Integrated Circuit Design and Technology.
  • Microwave Engineering.