Laser Light Scattering from Electrons and Phonons in Wide Bandgap Semiconductors.

Abstract

The aim of this study was the detection and characterization of impurity states in II-VI and I-III-VI2 semiconductors. Three techniques were employed to this end: (1) EPR at various temperatures; (2) local mode vibrational Raman spectroscopy; (3) spin-flip laser scattering at very high fields (= or > 150 kG). These studies of impurity states facilitate the development of quality control standards for two important classes of semiconductors. Substitutional impurities play a key role in the operation of p-n junction devices in these materials. It was felt that the detection of impurity states with very high g-values (of order ten) might lead to spin-flip lasers operative in the near IR with large tuning ranges. In fact, impurities with g approximately equal to 8 have been found in both CuAlS2 and CuGaS2 in the present study.

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1975
Accession Number
ADA008797

Entities

People

  • J. F. Scott

Organizations

  • University of Colorado Boulder

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Detection
  • Electromagnetic Scattering
  • Extrinsic Semiconductors
  • Impurities
  • Lasers
  • Light Scattering
  • Materials
  • P-N Junctions
  • Quality Control
  • Raman Spectroscopy
  • Scattering
  • Semiconductors
  • Spectroscopy
  • Spin Flip Lasers
  • Wide Bandgap Semiconductors

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Optical Physics and Photonics.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics