Production Engineering Measure for Low Noise Solid-State Oscillator.

Abstract

A new mesa etching technique is described which produces better defined mesas. This process increases the yield of useful chips from each wafer. A definite correlation between diode efficiency, AM noise levels, and diode capacitance is described. The present oscillator design is described and the existing deficiencies of this design are outlined. Corrections which can be made to this design to provide an acceptable oscillator are described.

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1973
Accession Number
ADA009775

Entities

People

  • Howard Epstein
  • Norman Balmuth
  • Robert E. Walline
  • Yongsik Lee

Organizations

  • M/A-COM Technology Solutions

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Capacitance
  • Deficiencies
  • Efficiency
  • Engineering
  • Low Noise
  • Noise
  • Oscillators
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity

Readers

  • Electronics Engineering
  • Semiconductor Device Technology
  • Software Engineering