Effects of Shadows on Photocurrent-Compensated Integrated Circuits.
Abstract
Simple calculations show that high-z components, such as wires, capacitors, and solder bonds, can easily cast shadows with edges only 25-micrometers wide when illuminated with a low-energy (E < 60 keV) x-ray beam. If one of these shadows falls between a photocurrent-compensating diode-transistor pair, the mismatch in dose can drastically reduce the transient hardness of the integrated circuit. Results of pulsed x-ray tests on the Texas Instruments RSN 54L 71 R-S flip-flop and RSN 54L 00 quad two-input nand gate showed that the upset threshold of a given state of the flip-flop was lowered by as much as a factor of 29 and the nand gate by a factor of 5.7.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 22, 1975
- Accession Number
- ADA009841
Entities
People
- Robert H. Vandre
Organizations
- The Aerospace Corporation