Effects of Stress on the Electrical Resistance of Ytterbium and Calibration of Ytterbium Stress Transducers

Abstract

The effect of dynamic compressive stress on the electrical resistance of 0.005 cm (2 mil) thick ytterbium foil was studied over the range 0 to 33.40 kbar. This material has been used successfully as the active element in dynamic stress transducers with major application to in situ geological measurements and laboratory measurements in inhomogeneous materials.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1973
Accession Number
ADA010262

Entities

People

  • Dennis E. Grady
  • John T. Rosenberg
  • Michael J. Ginsberg
  • Paul S. De Carli

Organizations

  • SRI International

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Chemistry
  • Crystal Structure
  • Electrical Properties
  • Electrical Resistance
  • Materials
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Measurement
  • Mechanical Properties
  • Mechanical Working
  • Mechanics
  • Phase Transformations
  • Tensile Strain
  • Yield Strength

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Polymer Science and Engineering.