Effects of Ion Beam Polishing on Alkali Halide Laser Window Materials,

Abstract

Samples of single crystal KCl, KCl-KBr, and polycrystalline pressure-induced recrystallized KCl were polished using an argon ion beam. The specimens were rotated at a constant rate during bombardment. The angle-of-incidence of the ion beam, the ion current, and the time of sample exposure were varied. After polishing the surfaces of the samples were examined by x-ray topography, scanning electron microscopy, transmission electron microscopy, and Nomarski techniques and the absorption coefficient of the materials was measured. The effects of different polishing rates and angles-of-incidence on surface quality and absorption characteristics of the selected alkali halide laser window materials are discussed.

Document Details

Document Type
Technical Report
Publication Date
May 07, 1975
Accession Number
ADA010459

Entities

People

  • C. V. Collins
  • H. G. Lipson
  • J. A. Bruce
  • J. J. Comer

Organizations

  • Air Force Cambridge Research Laboratories

Tags

DTIC Thesaurus Topics

  • Absorption
  • Absorption Coefficients
  • Angle Of Incidence
  • Coefficients
  • Crystals
  • Electron Microscopy
  • Electrons
  • Ion Beams
  • Ions
  • Materials
  • Microscopy
  • Polishing
  • Scanning Electron Microscopy
  • Single Crystals
  • Transmission Electron Microscopy
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene