Solder Cracking Study.

Abstract

The program involved the effect on joints when exposed to low-frequency thermal cycling and a definition of the metallurgical cracking mechanism. Four solder alloys (50Sn-50Pb, 63Sn-37Pb, 70Sn-30Pb, and 40Sn-60Pb) were exposed to low-frequency thermal cycles. Sample soldered joints on printed circuit boards were installed in an environmental test chamber and subjected to thermal cycling. An exhaustive study was performed on the tested soldered joints to detect any metallurgical changes resulting from testing and to define the metallurgical mechanism of solder failure. Examinations consisted of bright-light microscopy and scanning electron microscopy on soldered fillet faces, joint cross-sections, and fractured surfaces.

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1975
Accession Number
ADA010471

Entities

People

  • E. R. Bangs
  • R. E. Beal

Organizations

  • IIT Research Institute

Tags

DTIC Thesaurus Topics

  • Circuit Boards
  • Circuits
  • Electron Microscopy
  • Environmental Tests
  • Frequency
  • Joints
  • Microscopy
  • Printed Circuit Boards
  • Printed Circuits
  • Scanning Electron Microscopy
  • Soldered Joints

Fields of Study

  • Materials science

Readers

  • Metallurgy
  • Powder metallurgy of Titanium alloys.
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems