Surface Effects on Semiconductor Devices.
Abstract
Surface Effects on Semiconductor Devices was the topic of a one-day meeting sponsored by the Thin Films and Surfaces Group of the Institute of Physics, London. This report gives a brief outline of metal-insulator-semiconductor (MIS) relationships involving surface state potentials and densities. This is followed by a brief outline of the papers presented covering such topics as surface states, densities of states, effects of impurities, structural defects, and the impact of these effects on device physics, as well as methods for measuring, altering or controlling these effects. Most systems were based on silicon technology, but some III-V and II-VI semiconductor-systems were described. Titles and authors are listed.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 06, 1975
- Accession Number
- ADA011128
Entities
People
- Roy F. Potter
Organizations
- Office of Naval Research