Radiation Resistant CMOS/SOS Circuitry.

Abstract

The report describes the results of an investigation of CMOS/SOS circuits and processes for optimizing radiation hardness and reliability. Bias-temperature-stress and radiation tests were conducted on MOS transistors and CMOS inverter circuits fabricated using several different processing techniques.

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1975
Accession Number
ADA013266

Entities

People

  • Gordon J. Kuhlmann
  • Raymond A. Kjar

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Circuits
  • Electronic Equipment
  • Hardness
  • Inverter Circuits
  • Inverters
  • Radiation
  • Reliability
  • Transistors

Fields of Study

  • Engineering
  • Physics

Readers

  • Integrated Circuit Design and Technology.