A Scanning Electron Microscope Investigation of Statically Loaded Foundation Materials.

Abstract

Selected rock samples were prepared and tested to failure in bending, tension, and compression test modes within the vacuum stage of a scanning electron microscope. The load was applied very slowly so that crack initiation and growth could be observed. The latter was observed visually and was recorded by both photography and video tape. The cracked surfaces of the failed specimens were further evaluated by more standard methods; two evaluation techniques were used to determine the failure the mechanisms involved for each test mode and rock type studied.

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1975
Accession Number
ADA013403

Entities

People

  • James C. Aleszka
  • Raymond E. Aufmuth

Organizations

  • Construction Engineering Research Laboratory

Tags

DTIC Thesaurus Topics

  • Compression
  • Electron Microscopes
  • Electrons
  • Materials
  • Microscopes
  • Optical Equipment
  • Optical Magnification Devices
  • Photographic Equipment
  • Photographic Materials
  • Photographic Recording Media
  • Photography
  • Scanning
  • Scanning Electron Microscopes
  • Standards
  • Tapes
  • Video Tapes

Readers

  • Aerospace Test and Evaluation
  • Materials Science and Engineering.
  • Structural Dynamics.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems