Electron Beam Semiconductor S-Band Amplifier.

Abstract

During this period an improved meander line, deflection structure was fabricated and incorporated into a phosphor-screen, beam tester. It was tested and the measured beam deflection sensitivity is presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1975
Accession Number
ADA013421

Entities

People

  • J. A. Long

Organizations

  • Watkins-Johnson Company

Tags

DTIC Thesaurus Topics

  • Amplifiers
  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Deflection
  • Electron Beams
  • Electronics
  • Electrons
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Phosphors
  • Semiconductors
  • Sensitivity
  • Silicon Carbide
  • Solid State Electronics

Fields of Study

  • Physics

Readers

  • Aerospace Test and Evaluation
  • Microwave Engineering.
  • Optical Physics and Photonics.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems