Evaluation of Discrete Semiconductor Specifications. Volume III. Semiconductor Devices-Tests-Category Matrix.
Abstract
The prescribed methodology for this program is through analysis of the detail specifications with recommendations for advancing requirements for technical evaluation including recommended quality and reliability. Approximately 90 detail specifications covering recommended semiconductor devices have been technically documented. Additional quality and reliability documents to support these specifications are proposed and included. These include advanced controls to assure more satisfactory devices with recommendations for supporting manuals to assist in uniform implementation. A survey of various military projects preferred parts, those chosen for new design and review of information from other sources was made. Discussion with the controlling office provided the basis for study of the detailed devices and appropriate characteristics.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1975
- Accession Number
- ADA013924
Entities
People
- Arnold H. Fanzoi
- Donald E. Brown