Photoconductor Noise Measurements.
Abstract
The nature of the noise mechanisms that occur in photoconductive materials is summarized, and a brief analysis of the electrical circuit conventionally employed with photoconductors is given. The equations for the specific noise (N1) and specific responsivity (S1) of a photodetector are derived in detail. The noise characteristics of amplifiers are examined in general, and some practical guidelines are offered for making noise measurements. A brief introduction to spectral analysis and signal averaging is given, including a comparison between discrete and continuous averaging methods. The noise spectrum measurement capability of a typical instrumentation system is analyzed with respect to photoconductive devices. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 31, 1975
- Accession Number
- ADA014249
Entities
People
- Norman F. Stahlberg
Organizations
- The Aerospace Corporation