Optical Materials Characterization

Abstract

The refractive index of each of two prismatic samples of chemical vapor deposited (CVD) ZnSe was measured from 0.5086 micrometer to 18.2 micrometers by means of the minimum-deviation method on a precision spectrometer. Data were obtained at temperatures near 20C and 34C and each set of data was fitted to a three-term Sellmeier-type dispersion equation, which permits refractive index interpolation within several parts in 0.00001. From the data obtained at the two temperatures, dn/dT was calculated for both samples. A comparison of refractive index and dn/dT is made with other types of ZnSe. Preliminary photoelastic data are presented for single crystal specimens of Ge, reactive atmosphere processed (RAP) KCl, and KCl doped with KI. The Ge data, which was obtained at 10.6 micrometers differ from previously reported data. Data on the two types of KCl were obtained at 0.633, 0.644 and 10.6 micrometers. These data are compared with values from the literature. Also presented are revised photoelasticity data for CVD ZnSe. The design of an improved stressing apparatus that was developed for the measurement of photoelastic constants is discussed.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1975
Accession Number
ADA015636

Entities

People

  • Albert R. Feldman
  • Deane Horowitz
  • Irving H. Malitson
  • Marilyn J. Dodge
  • Rory M. Waxler

Organizations

  • National Institute of Standards and Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Compound Semiconductors
  • Crystals
  • Elastic Properties
  • Infrared Lasers
  • Lasers
  • Load Cells
  • Materials
  • Measurement
  • Optical Materials
  • Optical Properties
  • Photoelasticity
  • Physical Properties
  • Radiation
  • Refractive Index
  • Single Crystals
  • Temperature Coefficients

Readers

  • Materials Science and Engineering.
  • Spectroscopy.