Measurement of X-ray Cross Sections Relevant to a Scanning Ion Microscope.
Abstract
The following is discussed in this report: Design and construction of a novel soft X-ray spectrometer; Integration of the spectrometer into a concurrently designed and constructed vacuum system and electronic system; Measurement of the 280 eV K X-ray emission cross section for carbon foil bombarded with 1-3 MeV carbon, nitrogen and oxygen ions; Discovery and analysis of satellite lines and solid state effects in the 270-290 eV region of spectra measured during prosecution of the above item.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 07, 1975
- Accession Number
- ADA017020
Entities
People
- F. W. Martin
Organizations
- University of Maryland