Fault Analysis in Electronic Circuits and Systems.

Abstract

Several Studies resulting from a research program directed at the development of mathematical foundations for fault analysis in electronic circuits and systems are reported. Specific topics covered include fault analysis by functional methods, fault analysis in linear and affine sequential circuits, and fault prediction.

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1975
Accession Number
ADA018633

Entities

People

  • L. Tung
  • M. N. Ransom
  • R. Saeks
  • S. R. Liberty
  • S. Sangani

Organizations

  • Texas Tech University

Tags

DTIC Thesaurus Topics

  • Circuits
  • Electrical Circuits
  • Electrical Equipment
  • Electronic Circuits

Fields of Study

  • Engineering
  • Physics

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Mathematical Modeling and Probability Theory.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics