Mixed Free and Forced Convection Cooling in a Long Slender Tube with Inlet Effects

Abstract

Results are presented concerning an experimental study of mixed free and forced convection cooling of a long slender tube where the inlet is a high- speed jet which severely disrupts the normally expected boundary layer or free convection development. The similarity parameter GR/Re to the 2nd power ranged from 10 to 100, which would suggest free convection dominance were it not for the inlet jet. In contrast to most heat-transfer experiments, the tube was insulated from its external environment and its temperature was allowed to vary axially, circumferentially, and temporally in order to study the gradients induced in the tube by the free-forced convection process. The resulting rate of cooling of the tube was measured. Timewise and spatial temperature variation of both the tube and cooling air are presented for various pressure levels up to 28 atmospheres at nominally constant flow rates of 0.3 to 0.4 lb/sec. Heat-transfer coefficients derived from these data are found to be two to five times greater than anything expected from the classical Nusselt number relations. A physical model based on buoyant effects opposed by a convected decaying jet turbulence is correlated with the experimental results.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1975
Accession Number
ADA018653

Entities

People

  • Frederick L. Shope

Organizations

  • Arnold Engineering Development Complex

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Boundary Layer
  • Buoyancy
  • Coefficients
  • Convection
  • Data Reduction
  • Diameters
  • Energy
  • Fluid Dynamics
  • Fluid Flow
  • Heat Transfer
  • Heat Transfer Coefficients
  • Layers
  • Measurement
  • Prandtl Number
  • Reynolds Number
  • Temperature Gradients
  • Turbulent Mixing

Readers

  • Atmospheric Science / Meteorology, specifically Wind Wave Turbulence.
  • Combustion and Flow Dynamics.

Technology Areas

  • Microelectronics