Interference-Fit-Fastener Investigation

Abstract

The report presents analytical and experimental techniques for defining the stress-strain and deformation states around holes filled with tapered shank interference fit fasteners. A prescription for fatigue-life analysis and prediction is developed wherein the above noted data are used. Stresses and plastic strains around fastener holes are determined analytically for two- and three-dimensional elastic and elastic-plastic cases using AXISOL and MARC computer codes. These results are evaluated based on data obtained from the dislocation etching technique, speckle photography experiments, and electrical resistance strain gages. A fatigue analysis technique is developed based on (1) a mechanics analysis to estimate local stress and strain and (2) a calculation of fatigue damage. This analysis provides a good estimate of life to crack initiation. Fastener installation variables are studied and critical ones selected. Constant amplitude and spectrum loading fatigue tests are reported and the data used to verify fatigue life predictions.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1975
Accession Number
ADA018804

Entities

People

  • B. N. Leis
  • D. A. Utah
  • S. G. Sampath
  • Stephen C. Ford
  • W. Griffith

Organizations

  • Battelle Memorial Institute

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Energy and Power Technologies
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Axial Loads
  • Computer Programs
  • Computers
  • Fatigue Life
  • Fatigue Tests (Mechanics)
  • Finite Element Analysis
  • Measurement
  • Mechanical Properties
  • Mechanical Working
  • Mechanics
  • Modulus Of Elasticity
  • Photography
  • Plastic Explosives
  • Stress Analysis
  • Stress Strain Relations
  • Stresses
  • Test Methods

Fields of Study

  • Engineering
  • Physics

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Structural Dynamics.
  • Surface Engineering/Surface Coating Technology.