Stress Optical Properties of Solids in the 1 to 20 Micron Wavelength Region
Abstract
The application of a variation of intensity method using static uniaxial compressive stress and polarized light to measure stress-induced birefringence in the infrared wavelength region (approximately 1 to 12 microns) is described. The measurements were made at 296 K for the following materials: KCl, KBr, KI, NaCl, LiF, ZnS, ZnSe and SrF2, CaF2, MgF2 and a chalcogenide glass TI-1173 for the alkali halides the values of the stress optic coefficients obtained are in the range approximately 1 to 4 Brewsters, while for the non- oxide glasses values of 9 to 14 Brewsters were measured. Comparisons of measurements from experiments with a theoretical model which predicts the wavelength dispersion of stress birefringence cannot be fitted better than a factor of approximately 2.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1975
- Accession Number
- ADA018871
Entities
People
- John C. Corelli
- John P. Szczesniak
Organizations
- Rensselaer Polytechnic Institute