A Spectral Theoretic Approach to Fault Analysis in Linear Sequential Circuits

Abstract

In this paper the problem of fault analysis in linear and affine sequential circuits is treated. These classes of systems provide for the treatment of several linear and nonlinear faults common in digital circuitry. The solution to the linear and affine sequential circuit problem is obtained via the development of a spectral theory for such systems over finite fields. A stepwise fault analysis procedure for this problem class is presented along with many examples illustrating the advantages that memory provides in digital fault analysis.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1975
Accession Number
ADA018985

Entities

People

  • S. Sangani

Organizations

  • Texas Tech University

Tags

Communities of Interest

  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Circuits
  • Difference Equations
  • Digital Circuits
  • Eigenvalues
  • Electrical Engineering
  • Engineering
  • Equations
  • Frequency Domain
  • Military Research
  • Numbers
  • Semiconductors
  • Sequences
  • Simultaneous Equations
  • Transfer Functions
  • Universities
  • Vector Spaces

Fields of Study

  • Engineering
  • Mathematics

Readers

  • Operations Research
  • Parallel and Distributed Computing.
  • Radio communications and signal processing.