Characterization of Thin Film ZnSe Coatings Using IR Ellipsometry.
Abstract
Using a Gaertner L118GT ellipsometer as the basic instrument, an infrared ellipsometer was constructed. The polarizer and analyzer were commercial wire grid elements and the wave plate was made of AR coated cadmium sulfide. A CO2 laser was used as the light source. Five ZnSe films (deposited on glass substrates) were measured at angles of incidence of 45, 50, 60, 65, and 70 degrees. A Fortran IV computer program was used to calculate the refractive index and thickness of each film. The refractive index and thickness appeared to be a function of the angle of incidence, but the variation is believed to be caused by alignment of the quarter-wave plate. No conclusions can be drawn on the change in refractive index with film thickness since the results lack consistency.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1975
- Accession Number
- ADA019497
Entities
People
- Arnold L. Franklin Jr
Organizations
- Air Force Institute of Technology