Design and Fabrication of Radiation-Hardened MNOS Memory Array.

Abstract

The report describes work performed to develop a radiation-hardened MNOS memory array for use in a RAM memory of an airborne computer. A study of MNOS device operation led to the fabrication and test of several memory and fixed threshold transistors and 256-bit memory circuits. Environmental test data taken at three radiation simulation sources and under endurance stress is presented along with studies on circuit design, packaging, and system design.

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1975
Accession Number
ADA021421

Entities

People

  • H. A. R. Wegener
  • John M. Rogers
  • Paul Marraffino
  • Steven G. Rogich

Organizations

  • Sperry Corporation

Tags

DTIC Thesaurus Topics

  • Airborne
  • Computers
  • Control Simulators
  • Environmental Tests
  • Fabrication
  • Packaging
  • Radiation
  • Simulations
  • Simulators
  • Transistors

Fields of Study

  • Physics

Readers

  • Electronics Engineering
  • Parallel and Distributed Computing.
  • Vision Science/Vision Psychology/Cognitive Neuroscience.