Reliability Analysis of Microcircuit Failures in Avionic Systems (RAMFAS).
Abstract
The report describes the 12-month study of the Reliability Analysis of Microcircuit Failures in Avionic Systems (RAMFAS) program conducted on F-15 Avionic equipments during the period from June 1974 to June 1975. The objectives of this RAMFAS Program were: (1) To assess the reliability of current microcircuit technology in the avionics environment; (2) To assess the validity and effectiveness of presently used techniques for microcircuit procurement, screening quality assurance and reliability prediction. These objectives were to be achieved through in-depth microcircuit failure analysis and fallout data on the F-15 Head-Up Display (HUD) and Interference Blanker Set (IBS) equipments over the total procurement cycle during the study period. The report documents the analysis of 308 devices out of 438 microcircuit removals from 31,393 microcircuits assembled, tested and shipped to the field in 39 HUD and 35 IBS F-15 equipments.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1976
- Accession Number
- ADA021428
Entities
People
- D. L. Dohm
- R. J. Mccammack
- T. E. Utz
Organizations
- McDonnell Aircraft Corporation