Reliability Evaluation of Programmable Read-Only Memories (PROMs)

Abstract

The primary objectives of this study were to: (1) assess unique factors affecting the reliability of 1024-bit open collector programmable read-only memories (PROMs) from three technologies, i.e., nichrome fusible links, titanium-tungsten fusible links and avalanche induced migration (AIM) or 'blown diode' technology; (2) recommend programming, testing and screening guidelines for the subject PROMs; and (3) develop a failure prediction technique for the subject PROMs.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1976
Accession Number
ADA022667

Entities

People

  • C. M. Iii Dewitt
  • D. R. Jerand
  • K. L. Iii Wong
  • M. Penberg
  • T. M. Donnelly
  • W. W. Powell

Organizations

  • Hughes Aircraft Company

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Chemistry
  • Dielectrics
  • Electronics Industry
  • Electronics Laboratories
  • Fabrication
  • Failure Mode And Effect Analysis
  • Fungi
  • Heat Energy
  • Information Science
  • Manufacturing
  • Materials Processing
  • Materials Science
  • Modules (Electronics)
  • Plastic Explosives
  • Reliability
  • Semiconductors
  • Test And Evaluation

Readers

  • Computational Modeling and Simulation
  • Integrated Circuit Design and Technology.
  • Polymer Science and Engineering.