Reliability Evaluation of Semiconductor Memories.
Abstract
The report presents a study which was conducted to evaluate the reliability of high usage semiconductor memories. The study determined parametric and functional tests which are required for military specifications. Special attention was given to the application of functional tests to detect and screen out devices with pattern sensitivity. Five types which cover a large part of the wide spectrum of memory devices in use today were chosen for characterization and testing to determine optimum parametric and functional tests and limits required in military specifications for memories.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1976
- Accession Number
- ADA022862
Entities
People
- Albert C. L. Chiang