Automated Multiple Fault Test Generation for Combinational Networks.
Abstract
This report deals with multiple fault detection in combinational logic networks; the faults considered are those which may be represented by one or more lines stuck at logic value 0 or 1. Some new theorems and rules are presented which aid in the identification of masking faults, and an algorithm is developed which produces multiple fault detection test sets for single-output combinational logic networks. The algorithm uses a path sensitizing technique to generate tests for members of a set of prime faults; any network fault can be represented by a combination of faults from the prime fault set, and a test which detects all combinations of prime faults will detect any single or multiple fault in the network. A modified version of the algorithm is implemented in the FORTRAN computer programming language; the automated version produces test sets which are optimal or near-optimal and usually complete. In the test generation process, certain redundancies are also detected.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1976
- Accession Number
- ADA023174
Entities
People
- Robert A. Hendrix
Organizations
- Air Force Institute of Technology