Polyblends of Poly(Styrene-b-Butadiene-b-Styrene) and Polystyrene. II. Electron Microscopy.

Abstract

Electron micrographs of a series of polyblends of poly(styrene-b-butadiene-b-styrene), SBS, and polystyrene, PS, are presented. These polyblends were cast from three different solvents, i.e., tetrahydrofuran/methyl ethyl ketone (THF/MEK), benzene/heptane and carbon tetrachloride. PS of four different molecular weights were used. It is shown that when the molecular weight of PS exceeds that in the block copolymer, a third phase in the form of 'islands' is formed. Lamellar-like structures are formed in the block domains upon the addition of homopolymer. Stretching perturbs the morphology of the block domains somewhat, and produces craze marks in the PS islands. The craze marks are removed upon annealing. These results are discussed in conjunction with the observed mechanical behavior of the same polyblends reported in part I of this series.

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1976
Accession Number
ADA023218

Entities

People

  • G. Akovali
  • M. Niinomi
  • Meikun Shen

Organizations

  • University of California, Berkeley

Tags

DTIC Thesaurus Topics

  • Alkenes
  • Block Copolymers
  • Butadienes
  • Carbon Tetrachloride
  • Copolymers
  • Dielectric Polymers
  • Electron Microscopy
  • Electrons
  • Microscopy
  • Molecular Weight
  • Polystyrenes
  • Styrenes

Fields of Study

  • Materials science

Readers

  • Polymer Science and Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics