AN Optimal Algorithm for Testing Random Access Memories.
Abstract
This report presents an optimum algorithm to detect any single 'stuck-at-1,' 'stuck-at-0' fault and any combination of solid 'stuck-at-1,' 'stuck-at-0' multiple faults in a random access memory using only the n-bit memory address register and m-bit memory buffer register input input and output lines. It is shown that this algorithm requires 4 x 2n memory accesses. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1976
- Accession Number
- ADA023894
Entities
People
- C. R. P. Hartmann
- J. Knaizuk Jr.
Organizations
- Syracuse University