Initial Tests of Induced-Current Microcircuit Damage Produced by Lightning.

Abstract

The vulnerability of electronics systems to damage and malfunction produced by lightning strikes is reviewed. Initial test data are shown in which this damage phenomenon is verified. The requirements and problems inherent in a magnetic-field measurement with which to accomplish an in situ measurement of lightning transients are discussed, the next series of measurements are described, and future directions for the research are indicated. (AUthor)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1976
Accession Number
ADA024016

Entities

People

  • R. V. Anderson

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Electronics
  • Lightning
  • Magnetic Fields
  • Malfunctions
  • Measurement
  • Microcircuits
  • Microelectronics
  • Vulnerability

Readers

  • Atmospheric Science/Meteorology
  • Explosive Engineering.
  • Software Engineering

Technology Areas

  • Microelectronics