Gyro Torquer Short Analysis.

Abstract

A cooperative examination of short circuits in the torquer circuit of a gyroscope is described. The success of this examination was largely derived from careful planning that generated a list of 'all conceivable' short circuit models and guided each stage of the physical examination and testing to preserve the evidence so that each model could be checked. In the course of this plan, sectioning the gyro header revealed shorting bridges of electrodeposited copper that were identified by using the scanning electron microscope (SEM) and the ion microprobe mass analyzer (IMMA). With the defect-producing mechanism understood, particular remedial action could be recommended: in this case, removal of the circuit bias voltage that promoted electrodeposition of copper. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 20, 1975
Accession Number
ADA024423

Entities

People

  • Richard H. Jones

Organizations

  • The Aerospace Corporation

Tags

DTIC Thesaurus Topics

  • Circuits
  • Coatings
  • Electrodeposition
  • Electron Microscopes
  • Electroplating
  • Microscopes
  • Physical Examination (Medicine)
  • Scanning Electron Microscopes
  • Short Circuits

Readers

  • Electrical Engineering
  • Inertial Navigation Systems.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics