Acceptor Behavior of Implanted Beryllium in Gallium Arsenide and Gallium Arsenide Phosphide.

Abstract

Beryllium is known to be an acceptor in GaAs. Controlled Be doping of GaAs by standard diffusion or growth processes is very difficult. Its small mass, however, makes it more suitable for ion implantation doping of GaAs and GaAs(1-x)P(x) than Zn, which is the conventional acceptor. Implanted Zn diffuses rapidly during the anneal in these materials. Thus Zn implantation serves as a predeposition rather than a method of controlled doping. Photoluminescence and electrical measurements on Be-implanted GaAs and GaAs(1-x)P(x)(x approx. 0.38) presented in this work indicate excellent impurity activation and lattice reordering after room temperature implantation and suitable annealing. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1976
Accession Number
ADA025607

Entities

People

  • Pallab Kumar Chatterjee

Organizations

  • University of Illinois Urbana–Champaign

Tags

DTIC Thesaurus Topics

  • Annealing
  • Beryllium
  • Cooperation
  • Diffusion
  • Electrical Measurement
  • Elements
  • Gallium
  • Gallium Arsenides
  • Implantation
  • Impurities
  • Ion Implantation
  • Ions
  • Materials
  • Measurement
  • Metals
  • Photoluminescence

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics