Storage Reliability of Missile Materiel Program, Monolithic Bipolar SSI/MSI Digital Integrated Circuit Analysis.

Abstract

This report documents findings on the non-operating reliability of monolithic bipolar SSI/MSI digital integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail. This information is part of a research program being conducted by the U. S. Army Missile Command, Redstone Arsenal, Alabama. The objective of this program is the development of non-operating (storage) reliability prediction and assurance techniques for missile materiel. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1976
Accession Number
ADA026123

Entities

People

  • Dennis F. Malik

Organizations

  • RTX

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Accelerated Testing
  • Circuit Analysis
  • Circuits
  • Diagrams
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Reliability

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.