Cryogenic Emittance Spectrometer

Abstract

The design and fabrication of a high sensitivity cryogenic emittance Fourier interferometer system for measuring the infrared emission of low absorptance samples is described. The spectrometer, cooled to LN2 temperature has a maximum spectral resolution of 0.5 per cm in the 2.5 - 14 micrometer range and a noise equivalent emissivity limit of better than 0.000005 at 10 micrometer. In addition to the spectrometer the system includes a data processing system for the reduction and storage of the spectral data. The emissometer system has been tested and meets all specifications. Data obtained during the acceptance test phase of the program is presented in this report.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1976
Accession Number
ADA026203

Entities

People

  • James R. Engel
  • Paul G. Morse

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors
  • Space

DTIC Thesaurus Topics

  • Acceptance Tests
  • Air Force
  • Compound Semiconductors
  • Contracts
  • Data Processing
  • Detectors
  • Emittance
  • Engineering
  • Hard Copy
  • Helium Neon Lasers
  • Lasers
  • Low Temperature
  • Measurement
  • Specifications
  • Spectra
  • Standards
  • System Software

Fields of Study

  • Physics

Readers

  • Software Engineering
  • Spectroscopy.