Storage Reliability of Missile Materiel Program. Storage Reliability Analysis Summary Report. Volume 1. Electrical and Electronic Devices

Abstract

The report summarizes analyses on the non-operating reliability of missile electrical and electronic devices. The objective of the program is the development of non-operating (storage) reliability prediction and assurance techniques for missile materiel. Included are analyses of integrated circuits, semiconductors, vacuum tubes, resistors, capacitors, inductive devices, crystals, batteries, connections, connectors and printed wiring boards.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1976
Accession Number
ADA026275

Entities

People

  • Dennis F. Malik

Organizations

  • RTX

Tags

Communities of Interest

  • Advanced Electronics
  • Ground and Sea Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Aluminum Oxides
  • Capacitance
  • Chemistry
  • Crystal Structure
  • Electronic Equipment
  • Electronics Industry
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Integrated Circuits
  • Material Degradation Processes
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Modules (Electronics)
  • Plastic Explosives
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Software Engineering

Technology Areas

  • Microelectronics