Analysis of Electronic Component Damage Due to EMP.
Abstract
Carbon composition, metal film, carbon film, and metal oxide type resistors, damaged with electromagnetic pulses (EMP) of 0.1 microsec to 10 microsec, have been examined using a scanning electron microscope (SEM). Failure mechanisms as a function of EMP pulsewidth were investigated with specific interest in arcing failure at short pulsewidths. Evidence of arcing damage was found in all three film type resistors associated with the helix trimming cut in the film layer. Theoretical electric field potential profiles of the resistive film layer are supported by SEM photographs. This project was supported by AFWL/DYX, P.O. AFWL 76-201, through Frank J. Seiler Research Laboratory, W.U. 7903-03-88. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1976
- Accession Number
- ADA026364
Entities
People
- Robert B. Bell
Organizations
- United States Air Force Academy