Compounds and Properties of the Si-Al-O-N System.

Abstract

A product or quasi-equilibrium diagram for compounds formed in the system Si-Al-O-N at 1800 C in 1 atm N2 is presented. X-ray diffraction spectra for several new phases are given and the reaction and sintering processes are discussed. Data for the lattice expansion of the Beta-Si3N4 structure accompanying the incorporation of Al and O is presented, and used to calculate theoretical densities. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1976
Accession Number
ADA026520

Entities

People

  • J. M. Wimmer
  • N. S. Choudhury
  • Peter L. Land
  • R. W. Burns

Tags

DTIC Thesaurus Topics

  • Diffraction
  • Sintering
  • Spectra
  • Wave Phenomena
  • X Rays
  • X-Ray Diffraction

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