Electrode Mechanisms using Reflection and Electron Spectroscopy.

Abstract

The general objectives of our AFOSR research have emphasized the development of various spectroscopic methods in characterizing electrochemical reactions mechanisms. The reason for exploring spectroscopic methods for investigating electrode processes stemmed from a general lack of progress from monitoring the relatively unspecific parameters of current, potential and charge. To date, these studies have involved the development of the internal reflection spectroscopic (IRS) technique at optically transparent electrodes (OTE's) to monitor in situ surface electrode reactions. Reflection changes induced both by the diffusion of light absorbing species in solution, and by the alteration of the optical constants associated with the formation of electrode films have been observed. In addition, we initiated in 1971 the first experiments utilizing electron spectroscopy for chemical analysis (XPS or ESCA) for identifying the nature of surface films. Since that time we have been concerned with developing XPS as a mechanistic aid in following electrode reactions, primarily those where surface oxide films alter the electronic properties of the electrode surface. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1976
Accession Number
ADA027694

Entities

People

  • Nicholas Winograd

Organizations

  • Purdue University

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Chemical Analysis
  • Diffusion
  • Electrochemical Reactions
  • Electrodes
  • Electron Spectroscopy
  • Electrons
  • Films
  • Monitoring
  • Oxide Films
  • Oxides
  • Reflection
  • Spectroscopy

Readers

  • Electrochemical Surface Science
  • Theoretical Analysis.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene