Electrical Parameter Screens for Air Force Weapon Systems Hardness Assurance.

Abstract

The objective of this program was to verify that the angle of the S21 scattering parameter could be used as a neutron hardness assurance screen at the wafer stage of integrated circuit fabrication. The objective was accomplished by interfacing commercially available test equipment, making the necessary measurements, and comparing the actual with the predicted post-radiation DC common emitter forward current gain, denoted beta. The predicted beta values were based on calculations involving the measured angles of S21. (S21 is the scattering parameter or forward transmission (insertion) gain with the output part terminated in a matched load.) If the angles of S21 are measured over the proper frequency range, it is reasonable to expect the standard deviation of percent error in beta prediction to be less than 5. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1976
Accession Number
ADA028613

Entities

People

  • M. A. Ussery
  • Robert A. Bailey

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Circuit Testers
  • Circuits
  • Electronic Equipment
  • Fabrication
  • Frequency
  • Hardness
  • Integrated Circuits
  • Material Forming Processes
  • Measurement
  • Radiation
  • Scattering
  • Standards
  • Test Equipment
  • Weapon Systems
  • Weapons

Fields of Study

  • Physics

Readers

  • Control Systems Engineering.
  • Integrated Circuit Design and Technology.
  • Nuclear and Radiation Engineering.